The effect of annealing on structural, electrical and optical properties of nanostructured ZnS/Ag/ZnS films

AuthorsM. Neghabi , A. Behjat , S.M.B. Ghorashi, S.M.A. Salehi
JournalThin Solid Films
Page number5662–5666
Serial number519
Paper TypeFull Paper
Published At31 March 2011
Journal GradeISI
Journal TypeTypographic
Journal CountryIran, Islamic Republic Of

Abstract

In this paper a ZnS/Ag/ZnS (ZAZ) nano-multilayer structure is designed theoretically and optimum
thicknesses of ZnS and Ag layers are calculated at 35 and 17 nm, respectively. Several conductive transparent
ZAZ nano-multilayer films are deposited on a glass substrate at room temperature by thermal evaporation
method. Changes in the electrical, structural, and optical properties of samples are investigated with respect
to annealing in air at different temperatures. High-quality nano-multilayer films with the sheet resistance of
8 Ω/sq and the optical transmittance of 83% at 200 °C annealing temperature are obtained. The figure of merit
is applied on the ZAZ films and their performance as transparent conductive electrodes are determined.