| Authors | M. Zamani Babgohari, S.M. Bagher Ghorashib,∗, Gh. Mirjalili |
|---|---|
| Journal | Optik |
| Paper Type | Full Paper |
| Published At | 28 November 2016 |
| Journal Grade | ISI |
| Journal Type | Typographic |
| Journal Country | Iran, Islamic Republic Of |
Abstract
Polymeric thin films were fabricated by depositing three consecutive PVK/CA/PVK layers
using spin coating method. Deposition parameters such as materials, rotation speed,
rotation time and annealing conditions were determined and optimized to achieve homogenous
and transparent layers. Fabricated thin films contain granular microstructures. X-Ray
refraction pattern of PVK thin film showed that the annealed film was amorphous in 140 ◦C.
Refractive index and extinction coefficient of PVK were determined by transmission spectrum.
Transmission spectrum of samples showed that the layers absorb ultra-violet waves;
and these layers are transparent against visible waves. Annealing the layers causes higher
transparency. Optical band gap of layers was measured 3.5 eV which claims desirable consistency
with recent data.