The effect of annealing on structural, electrical and optical properties of nanostructured ZnS/Ag/ZnS films

نویسندگانM. Neghabi , A. Behjat , S.M.B. Ghorashi, S.M.A. Salehi
نشریهThin Solid Films
شماره صفحات5662–5666
شماره سریال519
نوع مقالهFull Paper
تاریخ انتشار31 March 2011
رتبه نشریهISI
نوع نشریهچاپی
کشور محل چاپایران

چکیده مقاله

In this paper a ZnS/Ag/ZnS (ZAZ) nano-multilayer structure is designed theoretically and optimum
thicknesses of ZnS and Ag layers are calculated at 35 and 17 nm, respectively. Several conductive transparent
ZAZ nano-multilayer films are deposited on a glass substrate at room temperature by thermal evaporation
method. Changes in the electrical, structural, and optical properties of samples are investigated with respect
to annealing in air at different temperatures. High-quality nano-multilayer films with the sheet resistance of
8 Ω/sq and the optical transmittance of 83% at 200 °C annealing temperature are obtained. The figure of merit
is applied on the ZAZ films and their performance as transparent conductive electrodes are determined.