A study of the optical properties and adhesion of zinc sulfide anti-reflection thin film coated on a germanium substrate

نویسندگانS.A.R. Firoozifar , A. Behjata,, E. Kadivarc, S.M.B. Ghorashia, M. Borhani Zarandia
نشریهApplied Surface Science
شماره صفحات۸۱۸– ۸۲۱
نوع مقالهFull Paper
تاریخ انتشار۳ September ۲۰۱۱
رتبه نشریهISI
نوع نشریهچاپی
کشور محل چاپایران

چکیده مقاله

To conduct this study, zinc sulfide (ZnS) thin films deposited on germanium (Ge) substrates were prepared
by an evaporation method. The effects of deposition rate and annealing on the optical properties and
adhesion of the ZnS thin films were investigated. The transmission intensity and the X-ray diffraction
(XRD) pattern of the samples showed that the transmittance of the samples decreases by increasing the
evaporation rates. However, with the increase of the annealing temperature, crystallinity of the thin films
improves which, in turn, results in the enhancement of the transmission intensity in a far infrared region.
The maximum grain size was obtained at the annealing temperature of 225 ◦C. Our experimental results
also show that evaporation rate and annealing influences the adhesion of ZnS thin films to Ge substrates.

tags: Annealing Optical properties ZnS Antireflection Adhesion Ge