| نویسندگان | S.A.R. Firoozifar , A. Behjata,, E. Kadivarc, S.M.B. Ghorashia, M. Borhani Zarandia |
|---|---|
| نشریه | Applied Surface Science |
| شماره صفحات | 818– 821 |
| نوع مقاله | Full Paper |
| تاریخ انتشار | 3 September 2011 |
| رتبه نشریه | ISI |
| نوع نشریه | چاپی |
| کشور محل چاپ | ایران |
چکیده مقاله
To conduct this study, zinc sulfide (ZnS) thin films deposited on germanium (Ge) substrates were prepared
by an evaporation method. The effects of deposition rate and annealing on the optical properties and
adhesion of the ZnS thin films were investigated. The transmission intensity and the X-ray diffraction
(XRD) pattern of the samples showed that the transmittance of the samples decreases by increasing the
evaporation rates. However, with the increase of the annealing temperature, crystallinity of the thin films
improves which, in turn, results in the enhancement of the transmission intensity in a far infrared region.
The maximum grain size was obtained at the annealing temperature of 225 ◦C. Our experimental results
also show that evaporation rate and annealing influences the adhesion of ZnS thin films to Ge substrates.